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VDI/VDE 2655 Blatt 1.3 Optical metrology of microtopographies - Calibration of interferometers and interference microscopes for form measurement

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German title
Optische Messtechnik an Mikrotopografien - Kalibrieren von flächenhaft messenden Interferometern und Interferenzmikroskopen für die Formmessung
Publication date
2020-02
Publisher
Engl. VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik
Related manuals
Number of pages
50
Available in
German, English
Abstract

This standard characterises interference microscopes with their measuring technology properties for measuring the surfaces of form elements. This includes the feedback and the calculation of the measurement uncertainty when measuring shape parameters. In addition to the interference microscopes described in VDI 2655 Part 1.1, the methods described here can also be applied to interferometers whose measuring fields can have dimensions of up to approx. Ø 20 mm.

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