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VDI 2267 Blatt 2

Determination of suspended matter in ambient air - Measurement of Al, As, Ba, Ca, Cd, Co, Cr, Cu, Fe, K, Mg, Mn, Na, Ni, Pb, Sb, Se, Sn, Tl, V, and Zn as part of the atmospheric deposition after sampling with bulk and wet only collectors using GF-AAS, ICP-OES and ICP-MS

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German title

Stoffbestimmung an Partikeln in der Außenluft - Messen von Al, As, Ba, Ca, Cd, Co, Cr, Cu, Fe, K, Mg, Mn, Na, Ni, Pb, Sb, Se, Sn, Tl, V und Zn als Bestandteil der atmosphärischen Deposition nach Probenahme mit Bulk- und Wet-only-Sammlern mittels GF-AAS, ICP-OES und ICP-MS

Publication date
2019-02
Publisher
Engl. VDI/DIN-Kommission Reinhaltung der Luft (KRdL) - Normenausschuss
Author
Technical Division Environmental Measurement Technologies
Related manuals
Number of pages
59
Available in
German, English
Abstract

This standard describes methods for the determination of elements in wet and bulk deposition after sampling with bulk and wet only samplers (e.g. according to DIN EN 15841 or VDI 4320 Part 2 and Part 3). The digestion solution is analysed with the help of furnace atomic absorption spectrometry (GFAAS), inductively coupled optical emission spectrometry (ICP-OES) or inductively coupled plasma mass spectrometry (ICP-MS). The measurement method can be especially used for the following purposes: measurement method for the determination of Arsenic, Cadmium, Lead and Nickel in atmospheric deposition according to DIN EN 15841; background measurements for the analysis of deposition of long-range transported air pollutants (e.g. spatial distribution and time tendencies); elements in dust precipitation according to TA Luft, according to Swiss Air Pollution Ordinance (LRV) or according to the measurement concept for the Austrian Immission Control Act Air; elements in dust precipitation in the surrounding of industrial plants (plant related measurements); determination of elements in dust precipitation at traffic-related sites and in urban background (e.g. spatial distribution and time tendencies). Suitable digestion methods are described in VDI 2267 Part 3.

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