VDI/VDE 5575 Blatt 2
X-ray optical systems - Measurement methods; Measurement set-up and methods for the evaluation of X-ray optical systems
Auf einen Blick
- Erscheinungsdatum
- 2019-12
- Englischer Titel
-
Röntgenoptische Systeme - Messverfahren; Messaufbau und Methoden zur Bewertung röntgenoptischer Systeme
- Seitenanzahl
- 31
- Erhältlich in
- Deutsch, Englisch
- Zugehörige Handbücher
Kurzreferat
The standard describes the measurement set-up and methods to evaluate X-ray optical systems. Methods to characterise geometric properties of X-rays are described as well as approaches for their spectral analysis. Coordinate systems for non-ambiguous description of the measurement set-up are defined. Positioning and detector systems suitable for the different measurement tasks are specified. An overview of common X-ray sources is given. The typical properties of the different X-ray sources relevant for their measurement are described.